Development of an electron electron ion coincidence analyzer for Auger photoelectron coincidence spectroscopy (APECS) and electron ion coincidence (EICO) spectroscopy
Development of an electron electron ion coincidence analyzer for Auger photoelectron coincidence spectroscopy (APECS) and electron ion coincidence (EICO) spectroscopy
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DOI：
10.1016/j.elspec.2007.02.018
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发表时间：
2007-10-01
影响因子：
1.9
通讯作者：
Mase, Kazuhiko
中科院分区：
文献类型：
--
作者：
Kakiuchi, Takuhiro;Kobayashi, Eiichi;Mase, Kazuhiko
我们研制了一台用于俄歇光电子符合谱和电子离子符合谱的电子离子符合分析仪。它由同轴对称镜电子能量分析器（coASMA）、微型柱面镜电子能量分析器（CMA）、微型飞行时间离子质谱仪（TOF-MS）、xyz工作台、倾斜调节机构和外径为203 mm的共平面法兰组成。和CMA对发射的电子进行能量分析和探测，通过测量清洁Si（1 1 1）7 x 7和Si（1 1 1）7 x 7的Si-LVV-Si-2 p APECS数据来测试新EEICO分析仪的性能。7 × 7被离解的H_2O覆盖，并通过测量凝聚的H_2O在4a（1）处的俄歇电子光离子符合（AEPICO）谱，
We have developed an electron electron ion coincidence (EEICO) analyzer for Auger photoelectron coincidence spectroscopy (APECS) and electron ion coincidence (EICO) spectroscopy. It consists of a coaxially symmetric mirror electron energy analyzer (coASMA), a miniature cylindrical mirror electron energy analyzer (CMA), a miniature time-of-flight ion mass spectrometer (TOF-MS), a xyz stage, a tilt-adjustment mechanism, and a conflat flange with an outer diameter of 203 mm. A sample surface is irradiated by synchrotron radiation, and emitted electrons are energy-analyzed and detected by the coASMA and the CMA, while desorbed ions are detected by the TOF-MS. The performance of the new EEICO analyzer was tested by measuring Si-LVV-Si-2p APECS data of clean Si(1 1 1)7 x 7 and Si(1 1 1)7 x 7 covered by dissociated H2O, and by measuring the Auger-electron photoion coincidence (AEPICO) spectra of condensed H2O at the 4a(1)