Surface Potential of MoS2 Depending on the Polarity of GaN Substrate Measured by Kelvin Probe Force Microscope
Surface Potential of MoS2 Depending on the Polarity of GaN Substrate Measured by Kelvin Probe Force Microscope
复制标题
开尔文探针力显微镜测量的 MoS2 表面电位随 GaN 衬底极性的变化
DOI:
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发表时间:
2021
期刊:
影响因子:
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通讯作者:
T. Araki and S. Mouri
中科院分区:
文献类型:
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作者:
R. Kaipeng;Y. Komichi;T. Araki and S. Mouri