Thermovoltage across a vacuum barrier investigated by scanning tunneling microscopy: Imaging of standing electron waves.

Thermovoltage across a vacuum barrier investigated by scanning tunneling microscopy: Imaging of standing electron waves.
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通过扫描隧道显微镜研究真空势垒上的热电压:驻电子波成像。

DOI:
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发表时间:
1995
期刊:
Physical Review B (Condensed Matter)
影响因子:
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通讯作者:
Läuger
Läuger
中科院分区:
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文献类型:
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作者:
Hoffmann;Grand;Möller;Rettenberger;Läuger

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通过加热扫描隧道显微镜的尖端,研究了真空势垒的热电压。它对样品电子结构的微小变化极为敏感。以Cu(111)为例,研究了Cu(111)表面的电子态。在阶跃边缘和其他缺陷处的反射导致干涉图样调制热电压高达2 μ V/K。数值计算很好地描述了这些发现,它证实了后者不同于电子态密度图。
The thermovoltage of a vacuum barrier has been studied by heating the tip of a scanning tunneling microscope. It is extremely sensitive to minor variations of the electronic structure of the sample. As an example an electronic surface state on Cu(111) has been investigated. The reflection at step edges and other defects leads to an interference pattern modulating the thermovoltage by up to 2 ensuremath{mu}V/K. The findings are well described by a numerical calculation which confirms that the latter differs from a map of the electronic density of states.