Soft-error resilience of the IBM POWER6 processor

Soft-error resilience of the IBM POWER6 processor
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IBM POWER6 处理器的软错误恢复能力

DOI：
10.1147/rd.523.0275
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发表时间：
2008
期刊：
IBM J. Res. Dev.
影响因子：
--
通讯作者：
Christopher R. Jones
Christopher R. Jones
中科院分区：
--
文献类型：
--
作者：
P. Sanda;J. W. Kellington;P. Kudva;R. Kalla;R. McBeth;J. Ackaret;Ryan Lockwood;J. Schumann;Christopher R. Jones

文献摘要

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IBM POWER6™处理器的错误检测和纠正功能支持对单事件干扰的高容忍度。利用质子和中子束诱导的故障注入对软错误恢复能力进行了测试。此外，在硬件仿真的POWER6处理器仿真模型上进行了统计故障注入。根据导致错误消失、已纠正错误、检查停止和不正确架构状态的锁存中断事件的比例来描述错误恢复能力。
The error detection and correction capability of the IBM POWER6™ processor enables high tolerance to single-event upsets. The soft-error resilience was tested with proton beam- and neutron beam-induced fault injection. Additionally, statistical fault injection was performed on a hardware-emulated POWER6 processor simulation model. The error resiliency is described in terms of the proportion of latch upset events that result in vanished errors, corrected errors, checkstops, and incorrect architected states.