Charge motion and trapping in insulators: surface and bulk effects
Charge motion and trapping in insulators: surface and bulk effects
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DOI：
10.1109/elinsl.1998.704636
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发表时间：
1998-06
期刊：
影响因子：
--
通讯作者：
H. Wintle
中科院分区：
文献类型：
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作者：
H. Wintle
在绝缘体中和绝缘体上流动的电流很小，但它们在应用中可能很重要，并且它们可以指示载流子运动的机制。发挥作用的过程包括流动性和电离、捕获和解捕获以及注入和阻塞。这些现象中的一些是材料固有的，而另一些则取决于杂质的数量和性质。在本文中，我集中在数据分析和解释的电荷测量在散装和表面上的问题。有些物质和过程已经被很好地理解，而另一些仍然模糊不清，特别是载体和陷阱的身份。解决这些问题需要投入大量的时间和金钱。
The electrical currents that flow in and on insulators are small, but they may be important in applications and they may indicate the mechanism of carrier motion. The processes which come into play include mobility and ionisation, trapping and detrapping, and injection and blocking. Some of these phenomena are intrinsic to the material, while others depend on the amount and nature of the impurities. In this paper, I concentrate on problems in data analysis and in the interpretation of charge measurements in the bulk and on surfaces. Some materials and some processes are well understood, while others remain obscure, particularly the identities of carriers and traps. A considerable investment of time and money will be required to solve these problems.