Thickness and resistivity variations over the upper surface of the human skull
Thickness and resistivity variations over the upper surface of the human skull
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DOI：
10.1007/bf01191074
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发表时间：
1993-01-01
期刊：
影响因子：
2.7
通讯作者：
Law, Samuel K.
中科院分区：
文献类型：
--
作者：
Law, Samuel K.
对成人头骨上表面的头骨厚度和电阻率变化进行了研究。对头骨的厚度进行物理测量，并对照片和 CT 扫描进行定性分析，以确定头骨的内部和外部特征。电阻率测量采用四电极法进行，范围为 1360 至 21400 Ohm-cm，总体平均值为 7560 ± 4130 Ohm-cm。发现缝合线的存在大大降低了电阻率。研究发现，缺少松质骨会增加电阻率，特别是对于来自颞骨的样品。对于三层骨，颅骨厚度和电阻率之间存在反比关系（n=12，p<0.001）。结果表明，头骨不能被视为均匀层，局部电阻率变化应纳入现实的几何和电阻头部模型中，以提高脑电图的分辨率。讨论了这些变化对头部模型的影响、确定这些变化的方法以及纳入现实头部模型。
A study of skull thickness and resistivity variations over the upper surface was made for an adult human skull. Physical measurements of thickness and qualitative analysis of photographs and CT scans of the skull were performed to determine internal and external features of the skull. Resistivity measurements were made using the four-electrode method and ranged from 1360 to 21400 Ohm-cm with an overall mean of 7560 +- 4130 Ohm-cm. The presence of sutures was found to decrease resistivity substantially. The absence of cancellous bone was found to increase resistivity, particularly for samples from the temporal bone. An inverse relationship between skull thickness and resistivity was determined for trilayer bone (n=12, p lt 0.001). The results suggest that the skull cannot be considered a uniform layer and that local resistivity variations should be incorporated into realistic geometric and resistive head models to improve resolution in EEG. Influences of these variations on head models, methods for determining these variations, and incorporation into realistic head models, are discussed.