Super-resolution imaging for sub-IR frequencies based on total internal reflection
Super-resolution imaging for sub-IR frequencies based on total internal reflection
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DOI：
10.1364/optica.408678
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发表时间：
2021-01-20
期刊：
影响因子：
10.4
通讯作者：
Hendry, Euan
中科院分区：
文献类型：
--
作者：
Barr, Lauren E.;Karlsen, Peter;Hendry, Euan
对于设计用于精确确定层厚度的测量，由于聚焦光束所需的角射线分布，在对光学厚度的灵敏度和横向分辨率之间存在自然的权衡。我们展示了一种近场成像方法，使亚波长的横向分辨率的图像与对比度依赖于光学厚度。我们照亮一个样品的全内反射几何形状，与光激活的空间调制器在近场，这使得光学厚度图像计算重建在几秒钟内。我们展示了我们的方法在140 GHz（波长2.15 mm），图像通常是严重限制在空间分辨率，并展示映射的光学厚度变化在不均匀的生物组织。由The Optical Society根据Creative Commons Attribution 4.0 License条款发布。
For measurements designed to accurately determine layer thickness, there is a natural trade-off between sensitivity to optical thickness and lateral resolution due to the angular ray distribution requited for a focused beam. We demonstrate a near-field imaging approach that enables subwavelength lateral resolution in images with contrast dependent on optical thickness. We illuminate a sample in a total internal reflection geometry, with a photoactivated spatial modulator in the near field, which allows optical thickness images to be computationally reconstructed in a few seconds. We demonstrate our approach at 140 GHz (wavelength 2.15 mm), where images are normally severely limited in spatial resolution, and demonstrate mapping of optical thickness variation in inhomogeneous biological tissues. Published by The Optical Society under the terms of the Creative Commons Attribution 4.0 License.