Digital design at a crossroads How to make statistical design methodologies industrially relevant
Digital design at a crossroads How to make statistical design methodologies industrially relevant
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处于十字路口的数字设计如何使统计设计方法与工业相关
DOI：
10.1109/date.2009.5090907
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发表时间：
2009
期刊：
影响因子：
--
通讯作者：
J. Haase
中科院分区：
文献类型：
--
作者：
Ulf Schlichtmann;Manuel Schmidt;H. Kinzelbach;M. Pronath;Volker Gloeckel;Manfred Dietrich;Uwe Eichler;J. Haase
统计分析通常被视为下一个EDA技术的时序和功率签署。对这一领域的研究大约在五年前就开始了。最近，投资者的兴趣似乎有所下降。此外，虽然很多焦点都放在研究基础上，但到目前为止，在工业上的应用很少。因此，包括英飞凌技术（领先的半导体IDM）、多所大学和研究机构以及EDA提供商在内的一个团队，在一个名为ldquoSigma65rdquo的公共资助项目中，解决了在工业中实现统计设计的关键挑战。Sigma65努力提供关键的基础，以允许从传统的确定性设计方法到由统计因素驱动的未来设计方法的变化。该项目从统计建模和库组件的优化开始，并扩展到用于在门级和更高级别设计ic的统计技术。在本文中，我们展示了该项目的一些结果，展示了工业视角、研究机构和EDA提供商之间的互动如何使解决方案在不久的将来已经适用。在概述了处理变化的工业角度的现状后，将给出统计时序和功率分析的最新结果。此外，还介绍了基于参数时序的快速产量估计的最新研究进展。
Statistical analysis is generally seen as the next EDA technology for timing and power sign-off. Research into this field has seen significant activity started about five years ago. Recently, interest appears to have fallen off somewhat. Also, while a lot of focus has been put on research fundamentals, extremely few applications in industry have been reported so far. Therefore, a group including Infineon Technologies as a leading semiconductor IDM and various universities and research institutes, as well as an EDA provider has tackled key challenges to enable statistical design in industry in a publicly funded project called ldquoSigma65rdquo. Sigma65 strives to provide key foundations to allow a change from traditional deterministic design methods to future design methods driven by statistical considerations. The project starts with statistical modeling and optimization of library components and ranges to statistical techniques for designing ICs on gate level and higher levels. In this paper, we present some results of this project, demonstrating how the interaction between industrial perspective, research institutions and EDA provider enables solutions which are applicable already in the near future. After an overview of the industrial perspective of the current situation in dealing with variations recent results on both statistical timing and power analysis will be given. In addition, recent research advances on fast yield estimation concerning parametric timing yield will be given.