Dynamics of silver photo-diffusion into Ge-chalcogenide films: time-resolved neutron reflectometry
Dynamics of silver photo-diffusion into Ge-chalcogenide films: time-resolved neutron reflectometry
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银光扩散到Ge硫族化物薄膜中的动力学：时间分辨中子反射计
DOI：
10.1088/1742-6596/619/1/012046
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发表时间：
2015
期刊：
影响因子：
--
通讯作者：
M Mitkova and M W A Skoda,
中科院分区：
文献类型：
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作者：
Y Sakaguchi;H Asaoka;Y Uozumi;Y Kawakita;T Ito; M Kubota;D Yamazaki;K Soyama;M Ailavajhala;M R Latif;K Wolf;M Mitkova and M W A Skoda,
银扩散到非晶态(a-)硫化物层中，而可见光照射Ag/a-硫化物薄膜，中子反射法是探测深度分布的时间演变而不会受到探针束本身损害的合适技术。本文报道了a-Ge40Se60/Ag/Si薄膜在可见光照射下的时间分辨中子反射率测量结果。从测量中我们发现，中子反射率分布发生了巨大的变化，包括全反射区的损失，即使在形成一个均匀的层后，也可以继续照射，这发生在开始照射后约50min。在这一阶段，用线性探测器观察到明显的镜外散射，用肉眼观察到表面粗糙度。
Silver diffuses into an amorphous (a-) chalcogenide layer while visible light illuminates Ag/a-chalcogenide films and neutron reflectometry is a suitable technique probing time evolution of the depth profiles without damaging the sample by the probe beam itself. In this paper, we report the results of time-resolved neutron reflectivity measurements of a-Ge 40 Se 60/Ag/Si films taken while the films are exposed to visible light. From the measurements, we found enormous changes in the neutron reflectivity profile, including a loss of total reflection region, with continuous illumination even after forming one homogeneous layer, which occurred about 50 min after starting illumination. At this stage, a clear off-specular scattering was observed by a linear detector and a surface roughness was observed with naked eyes.