Artefacts in X-ray microtomography of materials
Artefacts in X-ray microtomography of materials
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DOI：
10.1179/174328406x114117
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发表时间：
2006-09-01
影响因子：
1.8
通讯作者：
Elliott, J. C.
中科院分区：
文献类型：
--
作者：
Davis, G. R.;Elliott, J. C.
X射线显微断层摄影术正在成为生物和工程材料中微结构和失效机制研究中越来越受欢迎的工具，产生X射线线性衰减系数的三维（3D）图。该技术的局限性是由于，例如，有限的X射线通量，使用多色辐射（在实验室系统中），有限的分辨率，离散采样和X射线散射。这些在重建图像中产生伪影。了解这些伪影有助于将其与真实的特征区分开来，并且对于优化实验设计以最大限度地减少其对结果的影响非常重要。为了帮助识别，使用分析体模投影发生器计算模拟伪影。条纹，环，运动和射束硬化伪影被认为是以及在锥束几何形状的旋转和丢失信息的中心的错误的结果。还示出了具有运动和射束硬化伪影以及定心误差的真实的材料试样的断层图像的示例。
X-ray microtomography is becoming an increasingly popular tool in the study of microstructure and failure mechanisms in biological and engineering materials, producing three-dimensional (3D) maps of the X-ray linear attenuation coefficient. Limitations of the technique are due to, for example, limited X-ray flux, use of polychromatic radiation ( in laboratory systems), finite resolution, discrete sampling and X-ray scatter. These give rise to artefacts in the reconstructed image. Knowledge of these artefacts helps to distinguish them from real features and is important for optimising experimental design so as to minimise their effect on the results. To aid identification, artefacts were simulated computationally using an analytical phantom projection generator. Streak, ring, motion and beam hardening artefacts are considered as well as the results of errors in the centre of rotation and missing information in cone beam geometry. Examples of tomographic images of real materials specimens with motion and beam hardening artefacts as well as centring errors are also shown.