The formation of two-layered YBa2Cu3O7- delta superconducting films and their microwave surface resistance
The formation of two-layered YBa2Cu3O7- delta superconducting films and their microwave surface resistance
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双层YBa2Cu3O7-δ超导薄膜的形成及其微波表面电阻
DOI：
10.1088/0953-2048/6/1/002
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发表时间：
1993
影响因子：
3.6
通讯作者：
O. Vendik
中科院分区：
文献类型：
--
作者：
S. Karmanenko;V. Davydov;M. V. Belousov;R. Chakalov;G. O. Dzjuba;R. N. Il’in;A. Kozyrev;Y. Likholetov;K. F. Njakshev;I. Serenkov;O. Vendik
用常规的电子衍射、电子显微镜和特殊的光拉曼散射和中能离子背散射等方法研究了Ba2Cu3O7-Delta薄膜在BaxSr1-xTiO3/MgO异质外延层上的结构和晶体取向。厚度超过350 nm的薄膜可能由内部的高度取向层和外部的无取向层组成。在60 GHz和4.2K下测量的微波表面电阻Rs证实了薄膜结构的复杂性。结果表明，两层膜在静磁场中的微波响应由外层无定向层或颗粒层的损耗决定，在H-场中的依赖关系Rs(H-)从大约10Oe开始。
The structure and crystallographic orientation of YBa2Cu3O7- delta films on BaxSr1-xTiO3/MgO heteroepitaxial layers were investigated by the conventional methods of electron diffraction, electron microscopy and by specific methods of Raman scattering of light and backscattering of middle-energy ions. A film of over 350 nm thick may consist of an inner highly-oriented layer and an outer disoriented one. Measurements of the microwave surface resistance Rs at 60 GHz and 4.2 K have confirmed a complicated character of the film structure. It has been shown that the microwave response of two-layer films in a static magnetic field is determined by the losses in the outer disoriented or granular layer and that the dependence Rs(H-) appeals in the field H- starting from approximately 10 Oe.