Roughening transitions and the zero-temperature triangular Ising antiferromagnet
Roughening transitions and the zero-temperature triangular Ising antiferromagnet
复制标题
粗糙化转变和零温三角形伊辛反铁磁体
DOI：
10.1088/0305-4470/15/11/011
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发表时间：
1982
期刊：
影响因子：
--
通讯作者：
H. J. Hilborst
中科院分区：
文献类型：
--
作者：
H. Blote;H. J. Hilborst
零温度三角形伊辛反铁磁体映射到固体上固体（SOS）模型。该系统经历了一个粗糙化的过渡，其特征在于由一个临界指数α =1/2，由在光滑阶段的激发的情况下，和由畴壁激发（条纹）在粗糙的阶段。在无限SOS温度下的高度高度相关函数显式计算与已知的四点伊辛相关的帮助下。作者指出，一个具有可比较SOS解释的六顶点模型具有相同的临界温度、临界指数和临界振幅。这是支持现有的想法大学系统的条纹阶段。
The zero-temperature triangular Ising antiferromagnet is mapped onto a solid-on-solid (SOS) model. The system undergoes a roughening transition characterised by a critical exponent alpha =1/2, by the absence of excitations in the smooth phase, and by domain wall excitations (stripes) in the rough phase. At infinite SOS temperature the height-height correlation function is explicitly calculated with the aid of known four-point Ising correlations. The authors point out that a certain six-vertex model with a comparable SOS interpretation has an identical critical temperature, critical exponent and critical amplitude. This is in support of existing ideas on university in systems with striped phases.