Stereological correction method based on sectional texture analysis for the liberation distribution of binary particle systems
Stereological correction method based on sectional texture analysis for the liberation distribution of binary particle systems
复制标题
基于截面纹理分析的二元粒子系统解放分布体视校正方法
DOI：
10.1016/j.apt.2017.03.007
复制
发表时间：
2017
影响因子：
5.2
通讯作者：
Koyanaka Shigeki
中科院分区：
文献类型：
--
作者：
Ueda Takao;Oki Tatsuya;Koyanaka Shigeki
