Transmission-electron diffraction by MeV electron pulses
Transmission-electron diffraction by MeV electron pulses
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DOI：
10.1063/1.3602314
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发表时间：
2011-06-20
影响因子：
4
通讯作者：
Tanimura, K.
中科院分区：
文献类型：
--
作者：
Muro'oka, Y.;Naruse, N.;Tanimura, K.
我们开发了一种紧凑的超快电子衍射仪，包括一个激光驱动的射频光电阴极，产生3.0 MeV的探针电子脉冲，三级透镜光学，以及一个定制的相对论电子探测器。从180nm厚的Si单晶中检测到高质量的单次透射电子衍射，对衍射光束具有优异的特殊分辨率；光斑宽度为0.02 A（-1）。脉冲宽度估计为100秒的持续时间。讨论了电子束的特性和衍射仪的其他特性。(C) 2011年美国物理研究所。(doi: 10.1063/1.3602314)
We have developed a compact ultrafast electron diffractometer, consisting of a laser-driven rf photocathode that generates 3.0 MeV probe electron pulses, three-stage lens optics, and a custom-built detector for relativistic electrons. High-quality single-shot transmission electron diffraction has been detected from 180-nm-thick Si single crystals, with an excellent special resolution for diffracted beams; the spot width of 0.02 A(-1) is obtained. The pulse width is estimated to be 100 fs in duration. Characteristics of the electron beam and other diffractometer features are discussed. (C) 2011 American Institute of Physics. [doi:10.1063/1.3602314]