In-process range-resolved interferometric (RRI) 3D layer height measurements for wire plus arc additive manufacturing (WAAM)
In-process range-resolved interferometric (RRI) 3D layer height measurements for wire plus arc additive manufacturing (WAAM)
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DOI：
10.1088/1361-6501/ac440e
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发表时间：
2022-04-01
影响因子：
2.4
通讯作者：
Tatam, Ralph P.
中科院分区：
文献类型：
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作者：
Hallam, Jonathan M.;Kissinger, Thomas;Tatam, Ralph P.
在这项工作中，将用于绝对距离测量的距离分辨干涉测量（RRI）仪器集成到导线+电弧增材制造（WAAM）系统中，以提供层高度的过程监测，并讨论了体积和剖面监测的前景。在这个实验中，钛原料被用来制造一个由11个WAAM沉积层组成的150毫米长，13.5毫米高的壁。RRI进程内测量结果非常一致(
In this work a range resolved interferometry (RRI) instrument for absolute distance measurements is integrated into a wire + arc additive manufacturing (WAAM) system to provide in-process monitoring of layer height, and prospects for volume and profile monitoring are discussed. In this experiment titanium feedstock was used to create a 150 mm long, 13.5 mm high wall comprised of 11 WAAM deposited layers. The RRI in-process measurements are in very good agreement (