X-ray photoelectron characterization of 6H-SiC(0001)
X-ray photoelectron characterization of 6H-SiC(0001)
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6H-SiC(0001)的X射线光电子表征
DOI:
10.1103/physrevb.60.11653
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发表时间:
1999
影响因子:
3.7
通讯作者:
L. Kubler
中科院分区:
文献类型:
--
作者:
Laurent Simon;J. Bischoff;L. Kubler
X-ray photoelectron spectroscopy and photoelectron-diffraction (XPD) measurements are performed on $6H\ensuremath{-}\mathrm{SiC}(0001)$ for three different reconstructed surfaces: one Si-rich $3\ifmmode\times\else\texttimes\fi{}3$ and two C-rich $\sqrt{3}\ifmmode\times\else\texttimes\fi{}\sqrt{3}R30\ifmmode^\circ\else\textdegree\fi{}$ and $6\sqrt{3}\ifmmode\times\else\texttimes\fi{}6\sqrt{3}R30\ifmmode^\circ\else\textdegree\fi{}$ reconstructed surfaces. In each case, the $\mathrm{C}1s$ and $\mathrm{Si}2p$ core-level lines are shown and XPD patterns are compared with double-scattering calculations of an ideal unreconstructed surface. No significant differences have been observed in the experimental $\mathrm{C}1s$ and $\mathrm{Si}2p$ bulk component XPD patterns with the changes of the surface reconstruction. These experimental XPD patterns fit the simulations of an unreconstructed model fairly well. For the highly C-rich $6\sqrt{3}\ifmmode\times\else\texttimes\fi{}6\sqrt{3}R30\ifmmode^\circ\else\textdegree\fi{}$ reconstructed surface, XPD patterns of the different deconvoluted components of the $\mathrm{C}1s$ core line are presented. An agreement between the experimental $\mathrm{C}1s$ surface component XPD diagram and calculations allows us to propose a model for this reconstruction based on Si adatoms at ${T}_{4}$ sites covered by a commensurable graphite top layer.