The Topological Classification of Defects

The Topological Classification of Defects
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缺陷的拓扑分类

DOI:
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发表时间:
1995
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通讯作者:
M. Kleman
M. Kleman
中科院分区:
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作者:
M. Kleman

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本文首先概述了有序介质中不同维度缺陷理论的代数拓扑元素。然后提出了许多例子,主要是在液晶、准晶体中(其中缺陷被定义为高维超晶体中的表面缺陷),以及在受挫介质中(用弯曲空间晶体中的缺陷来描述)。将拓扑分类的结果与线缺陷的 Volterra 分类进行比较,这通常可以提供进一步的物理洞察。
This review paper starts with a overview of the algebraic topology elements of the theory of imperfections of various dimensionalities in ordered media. Then a number of examples are worked out, mostly in liquid crystals, quasicrystals —where defects are defined as surface defects in high dimension hypercrystals —, and in frustrated media — described in terms of defects in curved space crystals. The results of the topological classification are compared with the Volterra classification of line defects, which often provides further physical insight.