Surface Potential Mapping of Single Wall Carbon Nanotubes Connected to Nanogap electrodes by Kelvin probe Force Microscopy and AFM Potentiometry

Surface Potential Mapping of Single Wall Carbon Nanotubes Connected to Nanogap electrodes by Kelvin probe Force Microscopy and AFM Potentiometry
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通过开尔文探针力显微镜和 AFM 电位测量连接到纳米间隙电极的单壁碳纳米管的表面电位图

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发表时间:
2007
期刊:
影响因子:
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通讯作者:
K.Matsushige and H.Yamada
K.Matsushige and H.Yamada
中科院分区:
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文献类型:
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作者:
Y.Miyato;K.Kobayashi;K.Matsushige and H.Yamada

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