Automated structure‐factor refinement from convergent‐beam electron diffraction patterns
Automated structure‐factor refinement from convergent‐beam electron diffraction patterns
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DOI：
10.1107/s010876739201095x
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发表时间：
1993-05
期刊：
影响因子：
--
通讯作者：
J. Zuo
中科院分区：
文献类型：
--
作者：
J. Zuo
本文介绍了一种改进的会聚束电子衍射图结构因子自动化精化算法。除了细化的结构因子，吸收系数和样品厚度，新的算法包括光束方向的细化，包括弱束效应使用的贝特潜力和有限大小的探测器的影响。这些新功能的使用说明通过细化的MgO 200系统的反射。
An improved algorithm is described for automated structure-factor refinement using convergent-beam electron diffraction patterns. In addition to refinement of structure factors, absorption coefficients and sample thickness, the new algorithm includes beam-direction refinement, the inclusion of weak-beam effects using the Bethe potential and the inclusion of finite-sized detector effects. The use of these new features is illustrated through the refinement of the MgO 200 systematic reflections.