Measuring Electric Field Induced Subpicometer Displacement of Step Edge Ions
Measuring Electric Field Induced Subpicometer Displacement of Step Edge Ions
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DOI：
10.1103/physrevlett.109.146101
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发表时间：
2012-10-03
影响因子：
8.6
通讯作者：
Foster, Adam S.
中科院分区：
文献类型：
--
作者：
Kawai, Shigeki;Canova, Filippo Federici;Foster, Adam S.
我们提供了明确的证据表明，施加的静电场通过双峰动态力显微镜结合多尺度理论模拟的横向力相互作用的测量，在不同方向上的亚皮米的离子晶体表面的台阶原子的位移。这种小的不平衡，在静电相互作用的转移阴离子-阳离子导致一个非凡的远程功能电位的变化，现在可以检测到的双峰检测的极端灵敏度。
We provide unambiguous evidence that the applied electrostatic field displaces step atoms of ionic crystal surfaces by subpicometers in different directions via the measurement of the lateral force interactions by bimodal dynamic force microscopy combined with multiscale theoretical simulations. Such a small imbalance in the electrostatic interaction of the shifted anion-cation ions leads to an extraordinary long-range feature potential variation and is now detectable with the extreme sensitivity of the bimodal detection.