MAGNETIC SUSCEPTIBILITY THICKNESS CORRECTIONS FOR SMALL ARTEFACTS AND COMMENTS ON THE EFFECTS OF‘BACKGROUND’MATERIALS*
MAGNETIC SUSCEPTIBILITY THICKNESS CORRECTIONS FOR SMALL ARTEFACTS AND COMMENTS ON THE EFFECTS OF‘BACKGROUND’MATERIALS*
复制标题
小伪影的磁化率厚度校正以及对“背景”材料影响的评论*
DOI：
10.1111/j.1475-4754.2000.tb00868.x
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发表时间：
2000
期刊：
影响因子：
1.6
通讯作者：
I. J. Rigby
中科院分区：
文献类型：
--
作者：
O. Williams;M. C. Jones;P. Webb;I. J. Rigby
本文对KT-5勘探仪薄伪影磁化率测量的校正系数进行了实验测定。仪器使用准备块的Whin Sill粗玄岩。对于小于10 mm厚的样品，校正因子较大（> 1.4），而对于50 mm厚的样品，校正因子减小到1.01。对薄样品的测量也可能受到测量所用的背衬或基底材料的影响。“背景”材料，例如土壤或石膏，对人工制品的测量记录有很大的贡献，特别是对于低折射率的薄人工制品
Correction factors for magnetic susceptibility measurements on thin ( artefacts have been determined experimentally for a KT-5 Exploranium G S. instrument using prepared blocks of Whin Sill dolerite. The cor rection factor is large (> 1.4) for samples less than 10mm thick, and reduces to 1 01 for samples of 50mm thickness. Measurements on thin samples can also be affected by the backing or substrate material on which they are measured. ‘Background’material, for example, soil or plaster, can contribute significantly to recorded measurements on artefacts, particularly for thin artefacts with low susceptibilities