Charge state and pressure dependence of characteristic X-ray emission in collisions of Xe ions with rare-gas atoms
Charge state and pressure dependence of characteristic X-ray emission in collisions of Xe ions with rare-gas atoms
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DOI：
10.1088/0022-3700/14/8/016
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发表时间：
1981-04
期刊：
影响因子：
--
通讯作者：
A. Warczak;D. Liesen;W. Schönfeldt
中科院分区：
文献类型：
--
作者：
A. Warczak;D. Liesen;W. Schönfeldt
研究了1.4MeV/NXeq+（24 ~ 26.动态耦合的瞬态形成的准分子中的分子轨道被认为是负责这种增加。这些耦合特性的参数估计。所观察到的K和L的X射线发射的压力依赖性被发现是由于电荷状态变化的影响。
The charge state dependence of K and L X-ray emission has been studied for 1.4 MeV/N Xeq+ (24 26. Dynamic couplings between molecular orbitals in the transiently formed quasimolecule are found to be responsible for this increase. Parameters characterising these couplings are estimated. The observed pressure dependence of K and L X-ray emission is found to be due to charge state changing effects.