ESR and X-ray diffraction studies on thin films of poly-3-hexylthiophene: Molecular orientation and magnetic interactions

ESR and X-ray diffraction studies on thin films of poly-3-hexylthiophene: Molecular orientation and magnetic interactions
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DOI:
10.1016/j.tsf.2007.04.067
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发表时间:
2008-03
期刊:
影响因子:
2.1
通讯作者:
Keisuke Sugiyama;T. Kojima;H. Fukuda;H. Yashiro;T. Matsuura;Y. Shimoyama
Keisuke Sugiyama;T. Kojima;H. Fukuda;H. Yashiro;T. Matsuura;Y. Shimoyama
中科院分区:
材料科学3区
文献类型:
--
作者:
Keisuke Sugiyama;T. Kojima;H. Fukuda;H. Yashiro;T. Matsuura;Y. Shimoyama

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