Magnetic Stabilities And Noise Characteristics Of High Hc CoSm/Cr Thin Films
Magnetic Stabilities And Noise Characteristics Of High Hc CoSm/Cr Thin Films
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高 Hc CoSm/Cr 薄膜的磁稳定性和噪声特性
DOI：
10.1109/20.617816
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发表时间：
1997
期刊：
影响因子：
--
通讯作者：
T. Nishihara
中科院分区：
文献类型：
--
作者：
M. Mizukami;T. Abe;T. Nishihara
研究了曝光时间、退火温度和机械应力对CoSm/Cr薄膜磁稳定性的影响及其噪声特性。由于Sm被氧化，薄膜的矫顽力（He）随时间降低。通过保护涂层可以减少这种变化。随着退火温度的升高，Cr/CoSm/Cr薄膜的Hc降低。扩展X射线吸收精细结构（EXAFS）分析表明，在250/spl deg/C退火后，Co/sub 5/Sm相的比例增加。此外，膜的Hc随着压缩应变的增加而增加。变化值约为CoPt报告值的3倍。在97 kfci处的低噪声水平和高S/N通过在Cr溅射期间Ar气体压力的增加引起的弱交换耦合获得。
The effects of exposure time, annealing temperature and mechanical stress on the magnetic stability of CoSm/Cr thin films, as well as its noise characteristics, were studied. The coercivity (He) of the films decreases with time because the Sm is oxidized. This change is reduced by means of a protective over coat. With an annealing temperature increase, the Hc of Cr/CoSm/Cr film decreases. From Extended X-ray Absorption Fine Structure (EXAFS) analysis, it has been shown that the proportion of the Co/sub 5/Sm phase increases after annealing at 250/spl deg/C. Also, the Hc of the films increases with increasing compressive strain. The value of the change is about 3 times the value reported for CoPt. A low noise level and a high S/N at 97 kfci is obtained by weak exchange coupling caused by the increase in Ar gas pressure during Cr sputtering.