Improved conductivity and mechanism of carrier transport in zinc oxide with embedded silver layer

Improved conductivity and mechanism of carrier transport in zinc oxide with embedded silver layer
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DOI:
10.1063/1.2829788
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发表时间:
2008-01-01
影响因子:
3.2
通讯作者:
Alford, T. L.
Alford, T. L.
中科院分区:
物理与天体物理3区
文献类型:
--
作者:
Han, H.;Theodore, N. D.;Alford, T. L.

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研究了聚合物衬底上嵌入银层对氧化锌(ZnO)/银(Ag)/氧化锌(ZnO)层状复合结构电学和光学性能的影响。我们已经设计出具有大大改善的导电性的透明导电氧化物结构。光学和电学性质与Ag厚度相关。使用卢瑟福背散射光谱法测定膜厚度。霍尔效应,四点探针,紫外-可见分光光度计分析,我用来表征电气和光学性能。结果表明,载流子浓度、迁移率和电导率随着Ag厚度的增加而增加。将Ag厚度从8 nm增加到14 nm将薄层电阻和电阻率提高了六个数量级。复合结构的光学透射率降低时相比,一个单一的ZnO层相当的厚度。然而,具有12 nm的Ag的复合材料提供了光电器件可接受的电导率和透射率值。我们描述了Ag的厚度对ZnO/Ag/ZnO复合材料的电学和光学性质的影响,并提出了该系统的导电机制。
The effects of an embedded silver layer on the electrical and optical properties of zinc oxide (ZnO)/silver (Ag)/zinc oxide (ZnO) layered composite structures on polymer substrates have been investigated. We have engineered transparent conducting oxide structures with greatly improved conductivity. Optical and electrical properties are correlated with Ag thickness. Film thicknesses were determined using Rutherford backscattering spectrometry. Hall effect, four-point probe, and UV-Vis spectrophotometer analyses were I used to characterize electrical and optical properties. The results show that carrier concentration, mobility, and conductivity increase with Ag thickness. Increasing Ag thickness from 8 to 14 nm enhances sheet resistance and resistivity by six orders of magnitude. The optical transmittance of the composite structure decreases when compared to a single ZnO layer of comparable thickness. However, a composite with 12 nm of Ag provides conductivity and transmittance values that are acceptable for optoelectronic devices. We describe of the influence of Ag thickness on electrical and optical properties of the ZnO/Ag/ZnO composite and propose a conduction mechanism for this system.