Microscopy and its focal switch
Microscopy and its focal switch
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DOI：
10.1038/nmeth.1291
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发表时间：
2009-01-01
期刊：
影响因子：
48
通讯作者：
Hell, Stefan W.
中科院分区：
文献类型：
--
作者：
Hell, Stefan W.
直到不久前，人们还普遍认为，基于透镜的（远场）光学显微镜无法看到比光波长的一半更精细的细节。20世纪90年代初，克服衍射限制作用的可行物理概念的出现引发了一场探索，导致了具有纳米级空间分辨率的易于应用和广泛使用的荧光显微镜。在这里，我将讨论这些方法的原理以及它们在实现和操作方面的差异。最后，我概述了潜在的发展。
Until not very long ago, it was widely accepted that lens-based (far-field) optical microscopes cannot visualize details much finer than about half the wavelength of light. The advent of viable physical concepts for overcoming the limiting role of diffraction in the early 1990s set off a quest that has led to readily applicable and widely accessible fluorescence microscopes with nanoscale spatial resolution. Here I discuss the principles of these methods together with their differences in implementation and operation. Finally, I outline potential developments.