Microstructures and physical properties of colored layer of Cu-4 mass %Au alloy (Shakudou) fabricated by Japanese traditional technique
Microstructures and physical properties of colored layer of Cu-4 mass %Au alloy (Shakudou) fabricated by Japanese traditional technique
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DOI：
10.2320/jinstmet.69.1069
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发表时间：
2005-12-01
影响因子：
--
通讯作者：
Kitada, M
中科院分区：
文献类型：
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作者：
Kitada, M
研究了Niiro色Cu-4质量%Au合金（日文为“shakudou”）的显微组织和物理性能。样本是使用传统的日本金属工艺技术制造的。使用含有硫酸铜、明矾和人造铜绿的水溶液对合金片进行着色。着色在 373 K（100 摄氏度）下进行。使用透射电子显微镜观察精细结构。着色层的基体由结晶和非晶Cu2O组成，晶体尺寸为30～80nm。在生长的 Cu2O 和基体 Cu-Au 合金之间观察到 Cu2O{111}//Cu-Au{111} 关系。直径为2-5 nm的An细颗粒分布在Cu2O层中。通过AES分析，从着色层的顶部检测到从着色溶液引入的许多Cl和S杂质。着色样品的反射率约为未着色合金的 5%，并且观察到 450 nm 附近的宽反射峰。彩色样品的Cu2O/Cu-Au合金触点的阈值电压为0.2-0.3V。这大约是热氧化Cu2O/Cu-Au合金触点的1/3。着色主要是由于分布在Cu2O层中的细小的An颗粒对光的吸收和反射。
The microstructures and physical properties of Niiro-colored Cu-4 mass%Au alloy (shakudou in Japanese) have been investigated. Specimens are fabricated by using a traditional Japanese metal-craft technique. An aqueous solution containing cupric sulfate, alum and artificial verdigris is used to color the alloy sheets. Coloring is performed at 373 K (100 degrees C). The fine structures are observed using a transmission electron microscope. The matrix of the colored layer consists of crystalline and amorphous Cu2O and the crystal size is 30 similar to 80 nm. The relation Cu2O{111}//Cu-Au{111} is observed between the grown Cu2O and the matrix Cu-Au alloy. The An fine particles with 2-5 nm diameters are distributed in the Cu2O layer. Many impurities of Cl and S introduced from the coloring solution are detected from the top of the colored layer by AES analysis. The reflectance of the colored specimen is approximately 5% of the uncolored alloy and a broad reflection peak near 450 nm is observed. The threshold voltage Of Cu2O/Cu-Au alloy contact for the colored specimen is 0.2-0.3 V. This is approximately 1/3 of that of thermally oxidized Cu2O/Cu-Au alloy contact. The coloring is mainly due to light absorption and reflection by the fine An particles distributed in the Cu2O layer.