Fabrication and characterization of low cost Cu2O/ZnO:Al solar cells for sustainable photovoltaics with earth abundant materials
Fabrication and characterization of low cost Cu2O/ZnO:Al solar cells for sustainable photovoltaics with earth abundant materials
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DOI：
10.1016/j.solmat.2015.11.015
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发表时间：
2016-02-01
影响因子：
6.9
通讯作者：
Bakin, Andrey
中科院分区：
文献类型：
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作者：
Abdelfatah, Mahmoud;Ledig, Johannes;Bakin, Andrey
采用低成本电沉积法生长Cu2O薄膜，并通过实验确定了最佳吸收层厚度。Raman散射研究表明Cu2O为纯晶，SEM图像显示Cu2O薄膜由金字塔形状的颗粒组成。利用反射率、电流电压（J-V）、电容电压（C-V）和外量子效率（EQE）测量，研究了Cu2O吸光层厚度对异质结基本特性及其性能的影响。损耗层、少数载流子的电荷收集长度和反射率是描述器件性能的主要因素。当开路电压V-oc=035 V，短路电流密度J(sc)=6.21 mA cm(-2)，填充系数FF=50%时，效率最高，为1.09%。高斯拟合表明，相对于太阳能电池的高效率，膜厚度约为3 μ m是最佳的。C-V测量结果表明，太阳能电池效率最高时，内置电位的估计值为V-b=0.35 V，接口处受体浓度为N-A=4.375 × 10(16) cm（-3）。(C) 2015 Elsevier B.V.版权所有
The low cost electrodeposition method was used to grow Cu2O thin films and experimentally determine the optimal absorber layer thickness. Raman scattering studies indicate the presence of solely crystalline Cu2O and SEM images show that the thin films consist of grains with a pyramidal shape. The influence of the thickness of the light absorbing Cu2O layer on the basic characteristic of the heterojunction and their properties have been investigated using reflectivity, current-voltage (J-V), capacitance-voltage (C-V) and the external quantum efficiency (EQE) measurements. The depletion layer, the charge collection length of the minority carrier, and reflectivity are the main factors describing the device properties. The efficiency of 1.09% with an open circuit voltage of V-oc=035 V, a short circuit current density J(sc)=6.21 mA cm(-2) and a filling factor of FF=50% was obtained as the highest value for our solar cells. A Gaussian fit shows that the film thickness of around 3 mu m is an optimum with respect to a high efficiency of the solar cells. C-V measurements shows that the estimated value of the built-in potential is V-b=0.35 V and the acceptor concentration at the junction is N-A=4.375 x 10(16) cm(-3) for solar cell with the highest efficiency. (C) 2015 Elsevier B.V. All rights reserved.