Experimental evaluation of loss generation in HTS coils under various conditions
Experimental evaluation of loss generation in HTS coils under various conditions
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DOI：
10.1109/tasc.2005.849263
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发表时间：
2005-06
影响因子：
1.8
通讯作者：
T. Hemmi;N. Yanagi;K. Seo;R. Maekawa;K. Takahata;T. Mito
中科院分区：
文献类型：
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作者：
T. Hemmi;N. Yanagi;K. Seo;R. Maekawa;K. Takahata;T. Mito
为了研制高性能恒流工作的高温超导线圈，对高温超导线圈的损耗机理进行了研究。我们认为损耗的产生与屏蔽电流及其时间变化有关。为了研究屏蔽电流的特性，测量了不同条件下屏蔽电流的衰减，并在简单的实验中对这些影响进行了评估。
To develop the high performance HTS coil operated in persistent-current mode, loss mechanisms of the HTS coil have been studied. We consider that the loss generation is associated with the shielding current and its temporal variations. To investigate the shielding current characteristics, the decay of shielding currents were measured under various conditions, and we evaluated these effects in simple experiments.