Multicoincidence mass spectrometry applied to hexamethyldisilane excited around the silicon 2p edge
Multicoincidence mass spectrometry applied to hexamethyldisilane excited around the silicon 2p edge
复制标题
多重重合质谱应用于硅 2p 边缘周围激发的六甲基乙硅烷
DOI：
10.1021/j100122a011
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发表时间：
1993
期刊：
影响因子：
--
通讯作者：
P. Morin
中科院分区：
文献类型：
--
作者：
M. Simon;T. Lebrun;R. Martins;G. G. B. D. Souza;I. Nenner;M. Lavollée;P. Morin
采用光电子-光离子-光离子符合（PEPIPICO）质谱技术研究了Si 2 p芯电离。将离子产额光谱与四甲基硅烷分子的光谱进行比较，以指出由于Si-Si化学键引起的共振。简单符合质谱主要由SiC 3 H9+碎片离子组成，对光子波长的依赖性不强。PEPIPICO谱表明，SiC 3 H9+的解离动力学主要是分步碎裂，双电离总是涉及Si-Si化学键断裂，比Si-C断裂快
Photoelectron-photoion-photoion coincidence (PEPIPICO) mass spectrometry is applied to Si 2p core ionization. The ion yield spectrum is compared to the spectrum of the tetramethylsilane molecule in order to point out resonances due to the Si-Si chemical bond. Simple coincidence mass spectra are dominated by the SiC 3 H 9 + fragment ion and do not show a strong dependence on photon wavelength. PEPIPICO spectra demonstrate that dissociation dynamics is dominated by stepwise fragmentation of SiC 3 H 9 + and that double ionization always involves Si-Si chemical bond rupture, shown to be faster than the Si-C rupture