Experimental Assessment of Fault Coverage for Fault-Tolerant High-Performance Processors
Experimental Assessment of Fault Coverage for Fault-Tolerant High-Performance Processors
复制标题
容错高性能处理器的故障覆盖率实验评估
DOI：
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发表时间：
2007
期刊：
影响因子：
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通讯作者：
G. Jan
中科院分区：
文献类型：
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作者：
Meng;Yung;G. Jan
在本文中，我们提出了一个由错误检测、错误回滚恢复和重新配置机制组成的容错VLIW处理器故障覆盖的综合实验评估。我们在VHDL中实现了所提出的容错VLIW设计，并使用故障注入来研究故障持续时间、工作负载变化和允许的恢复过程数量对相关设计指标的影响，如性能下降、错误检测/恢复覆盖率以及故障安全和故障不安全概率。
In this paper, we present a comprehensive experimental assessment of fault coverage for a fault-tolerant VLIW processor, which consists of the error detection, error rollback recovery and reconfiguration mechanisms. We implement the proposed design of fault-tolerant VLIW in VHDL and employ the fault injection to investigate the effects of fault duration, workload variation and the number of recovery process allowed on the relevant design metrics, such as performance degradation, error detection/recovery coverage and fail-safe and fail-unsafe probabilities.