Quantitative atomic force microscopy
Quantitative atomic force microscopy
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DOI：
10.1088/1361-648x/aa6f8b
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发表时间：
2017-07-12
影响因子：
2.7
通讯作者：
Kuehnle, Angelika
中科院分区：
文献类型：
--
作者：
Soengen, Hagen;Bechstein, Ralf;Kuehnle, Angelika
各种原子力显微镜(AFM)模式被用于表面科学领域。最突出的原子力显微镜模式包括调幅(AM)和调频(FM)模式。多年来，已经开发了不同的方法来分析用不同的AFM模式获取的数据，其中每种分析通常基于特定于模式的假设和近似。检查各种分析方法中使用的看似不同的近似的有效性可能是一项乏味的任务。此外，对用不同方法分析的数据进行直截了当的比较可能是具有挑战性的。在这里，我们结合了已有的针对不同原子力显微镜模式的评估方法，提出了一套统一的三个方程。这三个AFM方程允许在调和近似下对AFM数据进行直接分析，而与AFM模式无关。这三个AFM方程提供了三条也是唯一一条关于谐和近似下的针尖-样本力的信息。我们通过对AM和FM模式下获得的三维AFM数据进行定量分析，证明了我们方法的一般性。
A variety of atomic force microscopy (AFM) modes is employed in the field of surface science. The most prominent AFM modes include the amplitude modulation (AM) and the frequency modulation (FM) mode. Over the years, different ways for analyzing data acquired with different AFM modes have been developed, where each analysis is usually based on mode-specific assumptions and approximations. Checking the validity of the seemingly different approximations employed in the various analysis methods can be a tedious task. Moreover, a straightforward comparison of data analyzed with different methods can, therefore, be challenging. Here, we combine the existing evaluation methods which have been separately developed for the different AFM modes and present a unifying set of three equations. These three AFM equations allow for a straightforward analysis of AFM data within the harmonic approximation, regardless of the AFM mode. The three AFM equations provide the three and only pieces of information about the tip-sample force available within the harmonic approximation. We demonstrate the generality of our approach by quantitatively analyzing three-dimensional AFM data obtained in both the AM and FM mode.