An evanescent-mode tester for ceramic dielectric substrates
An evanescent-mode tester for ceramic dielectric substrates
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陶瓷介电基板的倏逝模式测试仪
DOI：
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发表时间：
1988
期刊：
影响因子：
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通讯作者：
G. Kent
中科院分区：
文献类型：
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作者：
G. Kent
在低于截止频率的圆柱形波导中的TE/sub 01/模式用于探测位于输入和输出冷却回路之间的中心平面上的陶瓷介电基板。最大传输发生在由波导半径、衬底厚度和介电常数确定的频率处。介电常数和损耗角正切由谐振频率和吸收带宽获得。该测量对波导段之间的差距中的衬底位置不敏感，并且不需要紧密接触。>
The TE/sub 01/ mode in a cylindrical waveguide at a frequency below cutoff is used to probe a ceramic dielectric substrate located on the central plane between input and output cooling loops. Maximum transmission occurs at a frequency determined by the waveguide radius, the substrate thickness, and the dielectric constant. The dielectric constant and loss tangent are obtained from the resonant frequency and the absorption bandwidth. The measurement is insensitive to the position of the substrate in the gap between waveguide sections, and no intimate contact is required. >