Focused and coherent X-ray beams for advanced microscopies
Focused and coherent X-ray beams for advanced microscopies
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DOI:
10.1016/j.nimb.2023.03.036
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发表时间:
2023-04-10
影响因子:
1.3
通讯作者:
Bikondoa,Oier
中科院分区:
文献类型:
--
作者:
Carbone,Dina;Bikondoa,Oier