Computed Tomography for Application in Manufacturing Metrology

Computed Tomography for Application in Manufacturing Metrology
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计算机断层扫描在制造计量中的应用

DOI：
10.4028/www.scientific.net/kem.437.73
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发表时间：
2010
期刊：
Key Engineering Materials
影响因子：
--
通讯作者：
P. Krämer
P. Krämer
中科院分区：
--
文献类型：
--
作者：
A. Weckenmann;P. Krämer

文献摘要

被引文献

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As a rather new technology, X-Ray Computed Tomography offers new and promising possibilities in manufacturing metrology in comparison to well-established tactile or optical measurements. The main benefit is the volumetric model which results of each measurement and represents the measurement object holistically with high point density.