Diffraction enhanced imaging: a simple model
Diffraction enhanced imaging: a simple model
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DOI：
10.1088/0022-3727/39/19/004
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发表时间：
2006-10
期刊：
影响因子：
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通讯作者：
P. Zhu;Q. Yuan;Wanxia Huang;Junyue Wang;H. Shu;Bo Chen;Yijin Liu;Enrong Li;Ziyu Wu
中科院分区：
文献类型：
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作者：
P. Zhu;Q. Yuan;Wanxia Huang;Junyue Wang;H. Shu;Bo Chen;Yijin Liu;Enrong Li;Ziyu Wu
在针孔成像和常规X射线投影成像的基础上，利用简单的概念推导出了更一般的衍射增强成像方程。新的DEI方程不仅能解释Chapman提出的DEI方程所能解释的所有问题，而且还能解释旧的DEI方程所不能解释的一些问题，如分析器衍射的小角散射引起的噪声背景。
Based on pinhole imaging and conventional x-ray projection imaging, a more general DEI (diffraction enhanced imaging) equation is derived using simple concepts in this paper. Not only can the new DEI equation explain all the same problems as with the DEI equation proposed by Chapman, but also some problems that cannot be explained with the old DEI equation, such as the noise background caused by small angle scattering diffracted by the analyser.