The contrast-imaging function for tilted specimens
The contrast-imaging function for tilted specimens
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DOI：
10.1016/j.ultramic.2006.07.010
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发表时间：
2007-02-01
期刊：
影响因子：
2.2
通讯作者：
Engel, Andreas
中科院分区：
文献类型：
--
作者：
Philippsen, Ansgar;Engel, Hans-Andreas;Engel, Andreas
的对比度成像功能的理论描述推导出倾斜的标本，表现出弱相位对象的特性。我们表明，倾斜的对比度成像函数（TCIF）是一个线性变换，它可以近似为小倾角或小标本的卷积运算。这种近似是无效的电子层析成像，其中试样倾斜度超过60度和试样尺寸的金额约10 μ m。这种近似在电子晶体学中也被打破，因为电子晶体学要达到原子分辨率。因此，我们不做这种近似，并提出了一个通用的算法来反演TCIF。我们的描述的影响进行了讨论的背景下，电子断层扫描，单粒子分析，和电子晶体学，并定量地证明了提高分辨率。(c)2006 Elsevier B.V.保留所有权利。
A theoretical description of the contrast-imaging function is derived for tilted specimens that exhibit weak-phase object characteristics. We show that the tilted contrast-imaging function (TCIF) is a linear transformation, which can be approximated by the convolution operation for small tilt angles or for small specimens. This approximation is not valid for electron tomography, where specimen tilts are above 60 degrees and specimen dimensions amount to some 10 mu m. The approximation also breaks down for electron crystallography, where atomic resolution is to be achieved. Therefore, we do not make this approximation and propose a generalized algorithm for inverting the TCIF. The implications of our description are discussed in the context of electron tomography, single particle analysis, and electron crystallography, and the improved resolution is quantitatively demonstrated. (c) 2006 Elsevier B.V. All rights reserved.