Probing the atomic structure of amorphous Ta2O5 coatings

Probing the atomic structure of amorphous Ta2O5 coatings
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DOI:
10.1063/1.3535982
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发表时间:
2011-01-17
影响因子:
4
通讯作者:
Rowan, S.
Rowan, S.
中科院分区:
物理与天体物理2区
文献类型:
--
作者:
Bassiri, R.;Borisenko, K. B.;Rowan, S.

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低光学和机械损耗TA2O5无定形涂层在精确的光学测量系统中的应用越来越多。透射电子显微镜是探测这些涂层的原子结构的一种有希望的方法,以便更好地了解观察到的机械和光学损失的原因。使用反向蒙特卡洛改进和密度功能理论分子动力学模拟的实验性降低密度函数的分析表明,无定形的TA2O5的结构由簇组成,其簇从TA2O2环片段增加了贡献。 (c)2011年美国物理研究所。 [doi:10.1063/1.3535982]
Low optical and mechanical loss Ta2O5 amorphous coatings have a growing number of applications in precision optical measurements systems. Transmission electron microscopy is a promising way to probe the atomic structure of these coatings in an effort to better understand the causes of the observed mechanical and optical losses. Analysis of the experimental reduced density functions using a combination of reverse Monte Carlo refinements and density functional theory molecular dynamics simulations reveals that the structure of amorphous Ta2O5 consists of clusters with increased contribution from a Ta2O2 ring fragment. (C) 2011 American Institute of Physics. [doi:10.1063/1.3535982]