Towards 3D-Electrical Capacitance Tomography for Interface Detection Thresholding method improves accuracy for real-world 3D process monitoring
Towards 3D-Electrical Capacitance Tomography for Interface Detection Thresholding method improves accuracy for real-world 3D process monitoring
复制标题
用于界面检测的 3D 电容断层扫描阈值方法提高了现实世界 3D 过程监控的准确性
DOI：
10.1595/205651316x691537
复制
发表时间：
2016
影响因子：
2.3
通讯作者：
Clark P
中科院分区：
文献类型：
--
作者：
Clark P
