Molecular-beam epitaxy and characteristics of GaNyAs1-x-yBix -: art. no. 053505
Molecular-beam epitaxy and characteristics of GaNyAs1-x-yBix -: art. no. 053505
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DOI:
10.1063/1.2032618
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发表时间:
2005-09-01
影响因子:
3.2
通讯作者:
Yoshimoto, M
中科院分区:
文献类型:
--
作者:
Huang, W;Oe, K;Yoshimoto, M
GaNyAs1-x-yBix alloys were grown by molecular-beam epitaxy using solid Ga, Bi, and As sources and nitrogen radicals generated from nitrogen gas in rf plasma. Changing the growth temperature is found to be a convenient method for controlling the GaBi molar fraction in the alloy reproducibly. The photoluminescence (PL) spectra show that the PL peak energy of GaNyAs1-x-yBix alloy decreased with increasing GaBi and GaN molar fractions. The redshift coefficients of similar to 62 meV/%Bi and similar to 130 meV/%N at the PL peak energy of GaNyAs1-x-yBix were observed at room temperature. The temperature dependence of the PL peak energy in the temperature range of 150-300 K is much smaller than the temperature dependence of the band gap of InGaAsP. The temperature coefficients of GaAs1-xBix and GaNyAs1-x-yBix band gaps are governed by the GaBi molar fraction and they decrease with increasing GaBi molar fraction. GaNyAs1-x-yBix alloys with different PL peak energies and lattice matched to GaAs substrates were obtained. The photoluminescence peak energy was located at a predicted wavelength for the sample lattice matched to GaAs which was found to have the structure of Ga(N0.33Bi0.67)(z)As1-z.(c) 2005 American Institute of Physics.