Generation of compact test sets with high defect coverage
Generation of compact test sets with high defect coverage
复制标题
生成具有高缺陷覆盖率的紧凑测试集
DOI：
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发表时间：
2009
期刊：
影响因子：
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通讯作者：
K. Chakrabarty
中科院分区：
文献类型：
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作者：
X. Kavousianos;K. Chakrabarty
多检测（N-detect）测试的缺点是其测试长度随N线性增长。我们提出了一种新的方法来产生紧凑的测试集，提供高的缺陷覆盖率。所提出的技术明智地使用一个新的模式的输出偏差的概念的基础上的质量度量。我们从一个大型的N-detect模式库中选择最有效的模式，并保证一个小的测试集以及完整的固定覆盖率。基准电路的仿真结果表明，与一个紧凑的，1-检测固定在测试集，所提出的方法提供了相当高的过渡故障覆盖率和覆盖率斜坡上升相比，另一个最近发表的方法。此外，在所有情况下，所提出的方法无论是优于或有效的桥接故障覆盖和代理BCE+度量方面的竞争方法。在许多情况下，对于N的几个值，获得比大得多的N-检测测试集更高的过渡故障覆盖率。最后，我们的研究结果提供的见解，而不是使用N检测测试尽可能大的N，这是更有效的联合收割机的输出偏差度量与多检测测试，以获得高质量，紧凑的测试集。
Multi-detect (N-detect) testing suffers from the drawback that its test length grows linearly with N. We present a new method to generate compact test sets that provide high defect coverage. The proposed technique makes judicious use of a new pattern-quality metric based on the concept of output deviations. We select the most effective patterns from a large N-detect pattern repository, and guarantee a small test set as well as complete stuck-at coverage. Simulation results for benchmark circuits show that with a compact, 1-detect stuck-at test set, the proposed method provides considerably higher transition-fault coverage and coverage ramp-up compared to another recently-published method. Moreover, in all cases, the proposed method either outperforms or is as effective as the competing approach in terms of bridging-fault coverage and the surrogate BCE+ metric. In many cases, higher transition-fault coverage is obtained than much larger N-detect test sets for several values of N. Finally, our results provide the insight that, instead of using N-detect testing with as large N as possible, it is more efficient to combine the output deviations metric with multi-detect testing to get high-quality, compact test sets.