Mass mapping with the scanning transmission electron microscope.
Mass mapping with the scanning transmission electron microscope.
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使用扫描透射电子显微镜进行质量测绘。
DOI：
10.1146/annurev.bb.15.060186.002035
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发表时间：
1986
期刊：
影响因子：
--
通讯作者：
Hainfeld,JF
中科院分区：
文献类型：
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作者：
Wall,JS;Hainfeld,JF
在过去的几年里，扫描透射电子显微镜(STEM)的生产率出现了爆炸性的增长。随着标本的食用，标本制备和图像分析技术得到了显着的改进。然而，该仪器在解决结构生物学问题方面的全部潜力仍远未实现。我们预测，在接下来的几年里，STEM将逐渐进入目前仅由X射线和中子衍射占据的利基市场。
The past few years have witnessed an explosion in the productivity of the scanning transmission electron microscopy (STEM). With the food of specimens have come significant improvements in techniques of specimen preparation and image analysis. However, the full potential of the instrument for solving problems in structural biology is still far from realization. We predict that in the next few years the STEM will move gradually into the niche now occupied solely by x-ray and neutron diffraction.