Comparison of Micromagnetic and Point Probe Model in Magnetic Force Microscope Simulation

Comparison of Micromagnetic and Point Probe Model in Magnetic Force Microscope Simulation
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DOI:
10.1109/tmag.2007.904457
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发表时间:
2007-09
影响因子:
2.1
通讯作者:
J. Gong;D. Wei
J. Gong;D. Wei
中科院分区:
工程技术4区
文献类型:
--
作者:
J. Gong;D. Wei

文献摘要

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我们建立了一个磁力显微镜针尖的微磁模型,并与简单的探针模型进行了比较。我们模拟了MFM信号,以提供对垂直记录硬盘驱动器中写入头产生的场的测量的理解。当磁头主极气浮表面的磁极密度从0.2 T增加到1 T时,垂直各向异性的MFM针尖呈现花状磁化,而水平各向异性的针尖具有更复杂的开关模式。研究发现,垂直/水平各向异性针尖的信号比与针尖的平均磁场存在一一对应关系,但垂直各向异性针尖的磁矩切换会使信号比的符号发生变化。微磁学模拟结果与探针模型的结果非常相似,并与实验结果吻合较好。
We developed a micromagnetic model of magnetic force microscopy (MFM) tip to compare it with the simple point probe model. We simulated the MFM signal to provide an understanding of the measurement of the field generated by the write head in perpendicular recording hard disk drives. When the magnetic pole density at the air-bearing surface of the head's main pole is increased from 0.2 T to 1 T, the MFM tip with vertical anisotropy shows a flower-state magnetization, while the tip with horizontal anisotropy has more complicated switching modes. It is found that the signal ratio of the two MFM tips with vertical/horizontal anisotropy does have a one-to-one correspondence to the average magnetic field in the tip; however, the signal ratio may change sign because of the magnetic moments' switching in the tip with vertical anisotropy. The result of micromagnetic simulation is quite similar to that of the point probe model, and has good agreement with experiments.