Improved subthreshold swing of MoS2 negative-capacitance transistor by using HfZrAlO as ferroelectric layer of gate stack

Improved subthreshold swing of MoS2 negative-capacitance transistor by using HfZrAlO as ferroelectric layer of gate stack
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DOI:
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发表时间:
2023
期刊:
IEEE Trans. on Electron Devices
影响因子:
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通讯作者:
Jingping Xu
Jingping Xu
中科院分区:
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文献类型:
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作者:
Xinge Tao;Lu Liu;Jingping Xu

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