Spectral characterization of storage phosphor imaging plates
Spectral characterization of storage phosphor imaging plates
复制标题
存储荧光成像板的光谱表征
DOI：
10.1063/1.4865040
复制
发表时间：
2014
影响因子：
2.8
通讯作者：
C. Gollwitzer
中科院分区：
文献类型：
--
作者：
A. Deresch;M. Jechow;C. Gollwitzer
本文介绍了准单能x射线在8-60千电子伏特范围内的衰减和灵敏度测量。测量结果用于验证理论预测。对理论模型作了简要概述。该模型可用于描述不同类型探测器对大范围x射线能量的灵敏度。
This work presents attenuation and sensitivity measurements of radiographic imaging plates (IPs) with quasimonoenergetic X-rays in the 8–60 kiloelectronvolt range. The measurements are used to validate theoretical predictions. A short overview of the theoretical model is given. The model can be used to describe the sensitivity of different detector types to a wide range of X-ray energies.