ENHANCING BOARD FUNCTIONAL SELF-TEST BY CONCURRENT SAMPLING
ENHANCING BOARD FUNCTIONAL SELF-TEST BY CONCURRENT SAMPLING
复制标题
通过并发采样增强电路板功能自检
DOI：
10.1109/test.1991.519727
复制
发表时间：
1991
期刊：
影响因子：
--
通讯作者：
T. Williams
中科院分区：
文献类型：
--
作者：
K. Wagner;T. Williams
Board test using functioiial self-test code can be augmented by concurrently sampling signals at chip boundaries, compressing this data, and verifying its signature in-line in the code. This is a general method to enhance board test and diagnosis, po1,erXtidy adding every chip J/O pin as an observation point that is observed frequently and coupled to the self-test. Tests continue to execute at the normal board operating speed. This combination of fnnctional and strudural testing offers improved effectiveness over functional testing alone.
