Enhanced Ionization of Embedded Clusters by Electron-Transfer-Mediated Decay in Helium Nanodroplets
Enhanced Ionization of Embedded Clusters by Electron-Transfer-Mediated Decay in Helium Nanodroplets
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DOI：
10.1103/physrevlett.116.203001
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发表时间：
2016-05-19
影响因子：
8.6
通讯作者：
Mudrich, M.
中科院分区：
文献类型：
--
作者：
LaForge, A. C.;Stumpf, V.;Mudrich, M.
我们报告了电子转移介导的衰变（ETMD）的观察涉及镁（Mg）团簇嵌入氦（He）纳米液滴。ETMD是由He电离引起的，随后从Mg簇中移出两个电子，其中一个电子转移到He离子上，而另一个电子则发射到连续体中。该过程被证明是光子能量高于He电离势的嵌入式团簇的主要电离机制。对于大于5个原子的Mg团簇，我们观察到稳定的双电离团簇。因此，ETMD为掺杂纳米液滴中双电离冷态的形成提供了有效途径。
We report the observation of electron-transfer-mediated decay (ETMD) involving magnesium (Mg) clusters embedded in helium (He) nanodroplets. ETMD is initiated by the ionization of He followed by removal of two electrons from the Mg clusters of which one is transferred to the He ion while the other electron is emitted into the continuum. The process is shown to be the dominant ionization mechanism for embedded clusters for photon energies above the ionization potential of He. For Mg clusters larger than five atoms we observe stable doubly ionized clusters. Thus, ETMD provides an efficient pathway to the formation of doubly ionized cold species in doped nanodroplets.