Acquisition of Rutherford Backscattering Analysis System

特别是卢瑟福背散射光谱(RBS)已经发展成为薄膜和补体的主要分析技术，这是现有仪器所提供的，它强调整体表征或表面分析。RBS具有良好的元素特异性。成分信息是定量的，分析是无损的。使用该仪器的研究项目相当多样化，表明材料科学界对这项技术的兴趣日益浓厚。该设备的主要用户侧重于与薄膜、半导体材料和界面结构相关的领域。辅助用户使用RBS来表征腐蚀和分离工艺、半导体技术和等离子聚变应用中涉及的材料和反应。来自大学和行业来源的大量支持将有助于购买苏格兰皇家银行系统。

Rutherford Backscattering Spectrometry (RBS) in particular has evolved into major analytical technique for thin film and complements that available from existing instrumentation which emphasizes either bulk characterization or surface analysis. RBS offers good elemental specificity. The compositional information is quantitative and the analysis is nondestructive. The research projects using the instrumentation are quite diverse, and indication of the growing interest in this technique within the materials science community. The major users of the equipment emphasize areas related to thin films, semiconductor materials and interfacial structures. Auxiliary users utilize RBS to characterize the materials and reactions involved in corrosion and segregation processes, in semiconductor technology and in plasma fusion applications. Substantial support from the university and industrial sources will contribute to the purchase of the RBS system.