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Development and Testing of an Advanced Electron Optical System for Photoelectron Microscopes and Other High Resolution Imaging Systems

Development and Testing of an Advanced Electron Optical System for Photoelectron Microscopes and Other High Resolution Imaging Systems
用于光电子显微镜和其他高分辨率成像系统的先进电子光学系统的开发和测试
批准号:
8907619
负责人:
O. Griffith
金额:
$70.59万
依托单位:
依托单位国家:
美国
项目类别:
Continuing Grant
财政年份:
1989
资助国家:
美国
项目状态:
已结题
起止时间:
1989-07-01 至 1995-06-30

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中文摘要
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英文摘要
This grant application seeks funds to carry out the second phase of a joint project between Portland State University and the University of Oregon on the development of a photoelectron microscope (PEM) of advanced design and higher resolution (theoretically 1 nm to 2 nm, as compared with the present 10 nm). The project will achieve this resolution by incorporating an electron mirror to correct for chromatic and spherical aberrations. The first phase of this project was funded by a private foundation in the Northwest (the M. J. Murdock Chawitable Trust). The first phase covered the design and construction of an electron mirror and the electron lenses and other components used in studying the mirror, and theoretical and experimental investigations of the mirror properties. The second phase, planned for three years, focuses on further research on aberration correction, on mirror design, deflector design, and on instrument design and construction. Specific goals include a detailed study of the aberration correcting properties of the mirror in combination with the electron optical components of the photoelectron microscope in a vacuum optical bench, and the design and construction of an experimental test column in which the resolution of the corrected electron optical system can be evaluated. The successful demonstration of a corrected system would represent an advanced in the field of electron optics. The correction method would also be applicable to a range of other instruments which require aberration correction and improved resolution (e.g., electron or ion probes and advanced photoelectron microscope, when completed, will be valuable in studies of organic and biological specimens, semiconductors, and other surface studies where high resolution and low specimen damage are important.
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Development and Testing of an Aberration-Correction System for Photoelectron Microscopes and Other High Resolution Imaging Systems.
  • 批准号:
    9418884
  • 项目类别:
    Continuing Grant
  • 资助金额:
    $37.94万
  • 财政年份:
    1995
  • 负责人:
    O. Griffith
  • 依托单位:
Energy Oriented Instructional Laboratory For Undergraduate Education Students
  • 批准号:
    8001450
  • 项目类别:
    Standard Grant
  • 资助金额:
    $0.39万
  • 财政年份:
    1980
  • 负责人:
    O. Griffith
  • 依托单位:
Photoelectron Microscopy of Photosynthetic Membranes
  • 批准号:
    7911501
  • 项目类别:
    Continuing Grant
  • 资助金额:
    $10.0万
  • 财政年份:
    1979
  • 负责人:
    O. Griffith
  • 依托单位:
Collaborative Research on Photoelectron Microscopy of Chloroplast Membranes
  • 批准号:
    7622165
  • 项目类别:
    Continuing Grant
  • 资助金额:
    $13.54万
  • 财政年份:
    1976
  • 负责人:
    O. Griffith
  • 依托单位:
海外基金