Second International Congress on Optical Particle Sizing to be Held in Tempe/Phoenix, Arizona, March 5-9, 1990

第二届国际光学粒度测定大会将于 1990 年 3 月 5 日至 9 日在亚利桑那州坦佩/菲尼克斯举行

• 批准号: 8919167
• 负责人: Edwin Hirleman
• 金额: $ 1.05万
• 依托单位: Arizona State University
• 依托单位国家: 美国
• 项目类别: Standard Grant
• 财政年份: 1990
• 资助国家: 美国
• 起止时间: 1990-01-01 至 1990-12-31
• 项目状态: 已结题
• 来源: https://www.nsf.gov/awardsearch/showAward?AWD_ID=8919167&HistoricalAwards=false
• 关键词: Second; International; Congress; Optical; Particle

Funds are provided to partially support the Second International Congress on Optical Particle Sizing and the associated Workshop on Future Directions in Optical Particle Sizing Research, to be held March 5-9, 1990. The impetus comes from the researchers in the area who, because of the interdisciplinary nature of the many applications of particle technology, are active in a broad range of formal technical organizations and societies. The Congress and Workshop will bring together researchers from industry, government, and academia to discuss the present state and future needs for radiation sources and electro-optical components used in characterizing particles and dispensed media. Particulate and multi-phase flow processes control the ultimate performance of a large number of important systems involved in metallurgy, pharmaceuticals, atomization and sprays, cloud physics, and thermal or plasma spraying/coating. Advances in both research and industrial process facets of these applications will require improved diagnostics for the multi-phase system, with characterization of the dispersed phase being a dominant part. Optical methods for multi-phase flow diagnostics, by virtue of being noncontact, nonintrusive, and potentially real-time, will be required in next-generation sensors for intelligent process control.

提供资金部分支持第二个 国际光学粒度测量大会 光学粒子未来发展方向研讨会 施胶研究，1990年3月5日至9日举行。 的推动 来自该地区的研究人员，由于 粒子的许多应用的跨学科性质 技术，积极参与各种正式技术 组织和社会。 大会和研讨会将 汇集了来自工业界、政府和 学术界讨论的现状和未来的需要， 辐射源和电光元件， 表征颗粒和分配的介质。 颗粒和多相流过程控制着 大量重要系统的最终性能 涉及冶金、制药、雾化、 喷涂、云物理和热或等离子喷涂/涂覆。 研究和工业过程方面的进展 这些应用将需要改进的诊断， 多相系统，与分散的表征 阶段是一个主要的部分。 多相光学方法 流量诊断，由于是非接触式的，非侵入式的， 而且可能是实时的， 用于智能过程控制的传感器。